Effect of Trapped Charge Induced by Total Ionizing Dose Radiation on the Top-Gate Carbon Nanotube Field Effect Transistors

by Hongyu Ding, Jiangwei Cui, Qiwen Zheng, Haitao Xu, Ningfei Gao, Mingzhu Xun, Gang Yu, Chengfa He, Yudong Li, Qi Guo
Published 2023-02-01