A study on effects of total ionizing dose on hot carrier effect of PD I/O SOI PMOSFETs

by Jinghao Zhao, Qiwen Zheng, Jiangwei Cui, Hang Zhou, Xiaowen Liang, Xuefeng Yu, Qi Guo
Published 2019-06-01

Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices

by Xiao Li, Jiangwei Cui, Qiwen Zheng, Pengwei Li, Xu Cui, Yudong Li, Qi Guo
Published 2023-03-01

Effect of Trapped Charge Induced by Total Ionizing Dose Radiation on the Top-Gate Carbon Nanotube Field Effect Transistors

by Hongyu Ding, Jiangwei Cui, Qiwen Zheng, Haitao Xu, Ningfei Gao, Mingzhu Xun, Gang Yu, Chengfa He, Yudong Li, Qi Guo
Published 2023-02-01

Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate Irradiation

by Xiaolong Li, Xin Wang, Mohan Liu, Kunfeng Zhu, Guohua Shui, Qiwen Zheng, Jiangwei Cui, Wu Lu, Yudong Li, Qi Guo
Published 2024-01-01