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Modified SPC for short run test and measurement process in multi-stations
Academic Article
http://dx.doi.org/10.1088/1757-899x/328/1/012009
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Additional Document Info
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Overview
authors
Koh, C K
Chin, J F
Kamaruddin, Shahrul Bin
publication date
2018
published in
IOP Conference Series: Materials Science and Engineering
Journal
Identity
Digital Object Identifier (DOI)
https://doi.org/10.1088/1757-899x/328/1/012009
Additional Document Info
start page
012009
volume
328