Conference or Workshop Item

Singh, N.S.S. and Hamid, N.H. and Asirvadam, V.S. and Khalid, U. and Anwer, J. (2012) Evaluation of circuit reliability based on distribution of different signal input patterns. In: UNSPECIFIED.

Anwer, J. and Shaukat, S.F. and Khalid, U. and Hamid, N.H. (2012) Reliable area index: A novel approach to measure reliability of Markov Random Field based circuits. In: UNSPECIFIED.

Singh, N.S.S. and Hamid, N.H. and Asirvadam, V.S. and Khalid, U. and Anwer, J. (2012) Sensitivity analysis of Probability Transfer Matrix (PTM) on same functionality circuit architectures. In: UNSPECIFIED.

Anwer, J. and Khalid, U. and Singh, N. and Hamid, N.H. and Asirvadam, V.S. (2012) A novel error-detection mechanism for digital circuits using Markov random field modelling. In: UNSPECIFIED.

Khalid, U. and Anwer, J. and Singh, N. and Hamid, N.H. and Asirvadam, V.S. (2011) Determination of sensitive inputs of nanoscale digital circuits using Bayesian network analysis. In: UNSPECIFIED.

Khalid, U. and Anwer, J. and Singh, N. and Hamid, N.H. and Asirvadam, V.S. (2011) Improvement in reliability by changing the deterministic inputs of nanoscale circuits. In: UNSPECIFIED.

Khalid, U. and Anwer, J. and Singh, N. and Hamid, N.H. and Asirvadam, V.S. (2011) Reliability-evaluation of digital circuits using probabilistic computation schemes. In: UNSPECIFIED.

Khalid, U. and Anwer, J. and Singh, N. and Hamid, N.H. and Asirvadam, V.S. (2010) Computation and analysis of output error probability for C17 benchmark circuit using bayesian networks error modeling. In: UNSPECIFIED.

Anwer, J. and Fayyaz, A. and Masud, M.M. and Shaukat, S.F. and Khalid, U. and Hamid, N.H. (2010) Fault-tolerance and noise modelling in nanoscale circuit design. In: UNSPECIFIED.

Anwer, J. and Khalid, U. and Singh, N. and Hamid, N.H. and Asirvadam, V.S. (2010) Highly noise-tolerant design of digital logic gates using Markov random field modelling. In: UNSPECIFIED.

Anwer, J. and Khalid, U. and Singh, N. and Hamid, N.H. and Asirvadam, V.S. (2010) Joint and Marginal Probability analyses of Markov Random Field networks for digital logic circuits. In: UNSPECIFIED.

Book

Khalid, U. and Anwer, J. and Hamid, N.H. and Asirvadam, V.S. (2015) The impact of sensitive inputs on the reliability of nanoscale circuits. Springer International Publishing, pp. 249-269. ISBN 9783319200712; 9783319200705