Teodor Gotszalk

Teodor Paweł Gotszalk is a Polish scientist who is head of Department of Nanometrology at Wrocław University of Science and Technology. Corresponding member of Polish Academy of Sciences since 2022. Teodor Gotszalk works in the area of nanotechnology and nanometrology, particularly scanning probe microscopy (SPM), scanning electron microscopy (SEM) and focused ion beam (FIB) techniques, and using microelectromechanical systems (MEMS). Provided by Wikipedia
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  1. 1
    Adsorption properties of porous silicon
    by Teodor Gotszalk, Ivo W. Rangelow, Piotr Grabiec
    Published 2001-03-01
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  2. 2
    Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing
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  3. 3
    Force Spectroscopy with Quantitative On-Cantilever Force Control
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  4. 4
    Mechanical Impedance Analysis of a Novel MEMS Photon Force Sensor
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  5. 5
    Dielectric barrier discharge ionization in characterization of organic compounds separated on thin-layer chromatography plates.
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  6. 6
    The Application of Impedance Spectroscopy for <i>Pseudomonas</i> Biofilm Monitoring during Phage Infection
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  7. 7
    Microcantilever-based current balance for precise measurement of the photon force
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  8. 8
    Correlation between Friction and Wear in Cylindrical Anchorages Simulated with Wear Machine and Analyzed with Scanning Probe and Electron Microscope
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  9. 9
    Determination of the Electrical Parameters of Iodine-Doped Polymer Solar Cells at the Macro- and Nanoscale for Indoor Applications
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  10. 10
    Optimal Design of Electromagnetically Actuated MEMS Cantilevers
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  11. 11
    Metrology and control of electromagnetically actuated cantilevers using optical beam deflection method
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  12. 12
    Synergistic Effect of Precursor and Interface Engineering Enables High Efficiencies in FAPbI<sub>3</sub> Perovskite Solar Cells
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