The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors

by D. Simatos, L. J. Spalek, U. Kraft, M. Nikolka, X. Jiao, C. R. McNeill, D. Venkateshvaran, H. Sirringhaus
Published 2021-04-01

Water stability of organic and electrolyte-gated field-effect transistors

by Simatos, Dimitrios
Published 2022

Research data supporting The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors

by Simatos, Dimitrios, Spalek, Leszek, Kraft, Ulrike, Nikolka, Mark, Jiao, Xuechen, McNeill, Christopher, Venkateshvaran, Deepak, Sirringhaus, Henning
Published 2021