Optimization of NoC Wrapper Design under Bandwidth and Test Time Constraints Conference Paper

http://dx.doi.org/10.1109/ets.2007.30

authors

Hussin, Fawnizu Azmadi Bin
Yoneda, Tomokazu
Fujiwara, Hideo

publication date

2007

published in

12th IEEE European Test Symposium (ETS'07) Journal

Digital Object Identifier (DOI)

https://doi.org/10.1109/ets.2007.30