Enhancement in IEEE 1500 standard for at-speed test and debug Conference Paper

http://dx.doi.org/10.1109/dcas.2014.6965327

authors

Ali, Ghazanfar
Hussin, Fawnizu Azmadi Bin
Zain Ali, Noohul Basheer
Hamid, Nor Hisham bin
Adnan, Raja Mahmud

publication date

2014

Digital Object Identifier (DOI)

https://doi.org/10.1109/dcas.2014.6965327