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Delay design-for-testability for functional RTL circuits
Conference Paper
http://dx.doi.org/10.1109/iciteed.2015.7408997
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authors
Hussin, Fawnizu Azmadi Bin
Hamid, Nor Hisham bin
publication date
2015
Identity
Digital Object Identifier (DOI)
https://doi.org/10.1109/iciteed.2015.7408997
