Power-Constrained SOC Test Schedules through Utilization of Functional Buses Conference Paper

http://dx.doi.org/10.1109/iccd.2006.4380822

authors

Hussin, Fawnizu Azmadi Bin
Yoneda, Tomokazu
Fujiwara, Hideo
Orailoglu, Alex

publication date

2006

published in

2006 International Conference on Computer Design Journal

Digital Object Identifier (DOI)

https://doi.org/10.1109/iccd.2006.4380822