Items where Author is "Lee, W.F."
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Reaz, M.B.I. and Lee, W.F. and Hamid, N.H. and Lo, H.H. and Shakaff, A.Y.M. (2009) High degree of testability using full scan chain and ATPG-An industrial perspective. Journal of Applied Sciences, 9 (14). pp. 2613-2618. ISSN 18125654