TY  - JOUR
Y1  - 2018///
AV  - none
UR  - https://www.scopus.com/inward/record.uri?eid=2-s2.0-85046478993&doi=10.1007%2fs00542-018-3921-3&partnerID=40&md5=4bca8a1c26ed6cb43ff05b76fac048d2
N2  - Graphene consists of sheets of two-dimensional allotrope carbons and is a basic element of graphite. Herein, reduced graphene oxide (rGO) were exfoliated from graphite material under vacuum and low temperature and characterized by scanning electron microscopy, transmission electron microscopy, X-ray photoelectron spectroscopy (XPS), X-ray powder diffraction and Fourier transform infrared spectroscopy (FTIR). The results revealed that the obtained rGO is morphologically well structured in the size ranges of 1â??3 µm and smooth. An apparent reduction of O1s with XPS analysis was noticed. The crystalline nature of rGO was evidenced by (0 0 2) and (0 0 4) orientations. FTIR has generated clear peak stretches at 1018, 1092 and 1628 cmâ??1. Further, UVâ??visible and Raman spectroscopic optical analyses displayed the apparent peak profiles at appropriate positions. The appearance of G and D bands with the respective G/D ratio of peak intensity in Raman analysis aids to estimate D/G to be ~ 0.8. The calculated ratio with 2D/G is to be 1.7 with a single layer of graphene. Overall, the results of this study demonstrated that rGO can be obtained simply by vacuum assisted a low thermal exfoliation. © 2018, Springer-Verlag GmbH Germany, part of Springer Nature.
KW  - Fourier transform infrared spectroscopy; Graphite; High resolution transmission electron microscopy; Scanning electron microscopy; Temperature; Transmission electron microscopy; X ray photoelectron spectroscopy; X ray powder diffraction
KW  -  Crystalline nature; Exfoliated graphite; Graphite materials; Optical analysis; Raman spectroscopic; Reduced graphene oxides; Reduced graphene oxides (RGO); Scanning electrons
KW  -  Graphene
JF  - Microsystem Technologies
A1  - Gopinath, S.C.B.
A1  - Anbu, P.
A1  - Theivasanthi, T.
A1  - Arshad, M.K.M.
A1  - Lakshmipriya, T.
A1  - Voon, C.H.
A1  - Pandian, K.
A1  - Velusamy, P.
A1  - Chinni, S.V.
EP  - 5016
IS  - 12
N1  - cited By 13
SP  - 5007
TI  - Characterization of reduced graphene oxide obtained from vacuum-assisted low-temperature exfoliated graphite
PB  - Springer Verlag
ID  - scholars9562
SN  - 09467076
VL  - 24
ER  -