@article{scholars9562,
         journal = {Microsystem Technologies},
           title = {Characterization of reduced graphene oxide obtained from vacuum-assisted low-temperature exfoliated graphite},
          number = {12},
            note = {cited By 13},
           pages = {5007--5016},
            year = {2018},
          volume = {24},
       publisher = {Springer Verlag},
             doi = {10.1007/s00542-018-3921-3},
        abstract = {Graphene consists of sheets of two-dimensional allotrope carbons and is a basic element of graphite. Herein, reduced graphene oxide (rGO) were exfoliated from graphite material under vacuum and low temperature and characterized by scanning electron microscopy, transmission electron microscopy, X-ray photoelectron spectroscopy (XPS), X-ray powder diffraction and Fourier transform infrared spectroscopy (FTIR). The results revealed that the obtained rGO is morphologically well structured in the size ranges of 1{\^a}??3{\^A} {\^A}um and smooth. An apparent reduction of O1s with XPS analysis was noticed. The crystalline nature of rGO was evidenced by (0 0 2) and (0 0 4) orientations. FTIR has generated clear peak stretches at 1018, 1092 and 1628{\^A} cm{\^a}??1. Further, UV{\^a}??visible and Raman spectroscopic optical analyses displayed the apparent peak profiles at appropriate positions. The appearance of G and D bands with the respective G/D ratio of peak intensity in Raman analysis aids to estimate D/G to be {\texttt{\char126}} 0.8. The calculated ratio with 2D/G is to be 1.7 with a single layer of graphene. Overall, the results of this study demonstrated that rGO can be obtained simply by vacuum assisted a low thermal exfoliation. {\^A}{\copyright} 2018, Springer-Verlag GmbH Germany, part of Springer Nature.},
        keywords = {Fourier transform infrared spectroscopy; Graphite; High resolution transmission electron microscopy; Scanning electron microscopy; Temperature; Transmission electron microscopy; X ray photoelectron spectroscopy; X ray powder diffraction, Crystalline nature; Exfoliated graphite; Graphite materials; Optical analysis; Raman spectroscopic; Reduced graphene oxides; Reduced graphene oxides (RGO); Scanning electrons, Graphene},
             url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85046478993&doi=10.1007\%2fs00542-018-3921-3&partnerID=40&md5=4bca8a1c26ed6cb43ff05b76fac048d2},
            issn = {09467076},
          author = {Gopinath, S. C. B. and Anbu, P. and Theivasanthi, T. and Arshad, M. K. M. and Lakshmipriya, T. and Voon, C. H. and Pandian, K. and Velusamy, P. and Chinni, S. V.}
}