?url_ver=Z39.88-2004&rft_id=10.3923%2Fjas.2009.2613.2618&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.aufirst=M.B.I.&rft.aulast=Reaz&rft.au=Reaz%2C+M.B.I.&rft.title=Journal+of+Applied+Sciences&rft.issn=18125654&rft.atitle=High+degree+of+testability+using+full+scan+chain+and+ATPG-An+industrial+perspective&rft.volume=9&rft.date=2009&rft.pages=2613-2618&rft.issue=14&rft.genre=article