@article{scholars6853,
            year = {2016},
       publisher = {Polish ACAD Sciences Committee Metrology and Res Equipment},
         journal = {Metrology and Measurement Systems},
           pages = {461--480},
          number = {3},
          volume = {23},
            note = {cited By 97},
             doi = {10.1515/mms-2016-0028},
           title = {A review of surface deformation and strain measurement using two-dimensional digital image correlation},
            issn = {08608229},
          author = {Khoo, S.-W. and Karuppanan, S. and Tan, C.-S.},
        abstract = {Among the full-field optical measurement methods, the Digital Image Correlation (DIC) is one of the techniques which has been given particular attention. Technically, the DIC technique refers to a non-contact strain measurement method that mathematically compares the grey intensity changes of the images captured at two different states: before and after deformation. The measurement can be performed by numerically calculating the displacement of speckles which are deposited on the top of object{\^a}??s surface. In this paper, the Two-Dimensional Digital Image Correlation (2D-DIC) is presented and its fundamental concepts are discussed. Next, the development of the 2D-DIC algorithms in the past 33 years is reviewed systematically. The improvement of 2DDIC algorithms is presented with respect to two distinct aspects: their computation efficiency and measurement accuracy. Furthermore, analysis of the 2D-DIC accuracy is included, followed by a review of the DIC applications for two-dimensional measurements. {\^A}{\copyright} 2016 Polish Academy of Sciences.},
        keywords = {Computational efficiency; Deformation; Image analysis; Optical correlation, Computation efficiency; D. digital image correlation (DIC); Digital image correlations; Full field optical measurement; Fundamental concepts; Measurement accuracy; Surface deformation; Two-dimensional measurement, Strain measurement},
             url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84979302782&doi=10.1515\%2fmms-2016-0028&partnerID=40&md5=fb30f74390953411a621c55926c0ec91}
}