?url_ver=Z39.88-2004&rft_id=10.1109%2FICITEED.2015.7408997&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.aufirst=A.-U.-R.&rft.aulast=Shaheen&rft.au=Shaheen%2C+A.-U.-R.&rft.isbn=9781467378635&rft.title=Delay+design-for-testability+for+functional+RTL+circuits&rft.date=2015&rft.genre=proceeding