eprintid: 6074
rev_number: 2
eprint_status: archive
userid: 1
dir: disk0/00/00/60/74
datestamp: 2023-11-09 16:17:49
lastmod: 2023-11-09 16:17:49
status_changed: 2023-11-09 16:04:47
type: article
metadata_visibility: show
creators_name: Siti Nur Azella, Z.
creators_name: Noraini Muti, M.
title: Microscopy analysis of synthesized monodisperse SiO2 sphere
ispublished: pub
note: cited By 0
abstract: Silicon dioxide (SiO2) has been extensively studied due to their unique properties that make it desirable for many applications ranging from electronic, catalysis, pigment as well as sensors. Multitude of methods and processes are established with the ability to manipulate and control the key properties that can cater for specific applications. Stober method is a very simple and easy for up-scale production of SiO2. This paper presents the experimental study on the effect of synthesis parameter on the morphology of SiO2 synthesized via Stober method. Three parameters were investigated such as concentration of catalyst, concentration of precursor and percentage of water content. The obtained samples were characterized using scanning electron microscopy (SEM) analysis. The findings showed that the size of particles produced is dependent on the synthesis parameter. In this study, particles size ranging from 50 nm to >100 nm are easily produced. The sphere size of SiO2 can be increased by increasing the concentration of ammonia hydroxide catalyst, the concentration of TEOS, as well as the percentage of water content. © 2019, Microscopy Society of Malaysia. All rights reserved.
date: 2015
publisher: Microscopy Society of Malaysia
official_url: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85065170408&partnerID=40&md5=fec70b2ae2c15d71e4d561e027fed51e
full_text_status: none
publication: Malaysian Journal of Microscopy
volume: 11
number: 1
pagerange: 115-120
refereed: TRUE
issn: 18237010
citation:   Siti Nur Azella, Z. and Noraini Muti, M.  (2015) Microscopy analysis of synthesized monodisperse SiO2 sphere.  Malaysian Journal of Microscopy, 11 (1).  pp. 115-120.  ISSN 18237010