<> "The repository administrator has not yet configured an RDF license."^^ . <> . . . "Resistive open faults detectability analysis and implications for testing low power nanometric ICs"^^ . "Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability risks. The nonmonotonic dependence of ROF-induced delay faults on the supply voltage (VDD) poses a concern as to whether single-VDD testing will suffice for low power nanometric designs. Our analysis shows multi-VDD tests could be required, depending on the test speed. This knowledge can be exploited in small delay fault testing to reduce the chances of test escapes while minimizing cost. © 1993-2012 IEEE."^^ . "2015" . . "23" . "3" . . "Institute of Electrical and Electronics Engineers Inc."^^ . . . "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"^^ . . . "10638210" . . . . . . . . . . . . . . . . "M.T."^^ . "Mohammadat"^^ . "M.T. Mohammadat"^^ . . "F.A."^^ . "Hussin"^^ . "F.A. Hussin"^^ . . "N.B.Z."^^ . "Ali"^^ . "N.B.Z. Ali"^^ . . "M."^^ . "Zwolinski"^^ . "M. Zwolinski"^^ . . . . . "HTML Summary of #6000 \n\nResistive open faults detectability analysis and implications for testing low power nanometric ICs\n\n" . "text/html" . .