?url_ver=Z39.88-2004&rft_id=10.1109%2FTVLSI.2014.2312357&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.aufirst=M.T.&rft.aulast=Mohammadat&rft.au=Mohammadat%2C+M.T.&rft.title=IEEE+Transactions+on+Very+Large+Scale+Integration+(VLSI)+Systems&rft.date=2015&rft.volume=23&rft.issn=10638210&rft.issue=3&rft.atitle=Resistive+open+faults+detectability+analysis+and+implications+for+testing+low+power+nanometric+ICs&rft.pages=580-583&rft.genre=article