TY  - CONF
N1  - cited By 2; Conference of 2009 International Conference on Computer and Electrical Engineering, ICCEE 2009 ; Conference Date: 28 December 2009 Through 30 December 2009; Conference Code:79725
N2  - Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, Shape From Focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation. © 2009 IEEE.
SP  - 529
ID  - scholars593
TI  - Analysis of effects of texture reflectance and source illumination on focus measures for microscopic images
KW  - 3DShape recovery; Accuracy and precision; Analysis of various; Depth Estimation; Depth map estimation; Focus measure; Integral part; Microscopic image; Microscopic objects; Passive methods; Shape from focus
KW  -  Electrical engineering; Estimation; Reflection; Shape optimization; Textures
KW  -  Three dimensional
CY  - Dubai
AV  - none
A1  - Malik, A.S.
A1  - Choi, T.-S.
UR  - https://www.scopus.com/inward/record.uri?eid=2-s2.0-77950851951&doi=10.1109%2fICCEE.2009.148&partnerID=40&md5=df175d39aab4b58ecd817dd2f77340d4
EP  - 532
VL  - 2
Y1  - 2009///
SN  - 9780769539256
ER  -