?url_ver=Z39.88-2004&rft_id=10.7567%2FJJAP.53.011601&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.aufirst=M.&rft.aulast=Weis&rft.au=Weis%2C+M.&rft.atitle=Modified+transmission-line+method+for+evaluation+of+the+contact+resistance%3A+Effect+of+channel-length-dependent+threshold+voltage&rft.issue=1&rft.volume=53&rft.issn=00214922&rft.date=2014&rft.title=Japanese+Journal+of+Applied+Physics&rft.genre=article