TY  - JOUR
KW  - Benchmarking; CMOS integrated circuits; Computational methods; MATLAB; Nanotechnology
KW  -  Benchmark tests; Circuit systems; CMOS technology; Comparative studies; Computational approach; Computational methodology; ITS applications; Reliability tools
KW  -  Reliability
ID  - scholars5311
UR  - https://www.scopus.com/inward/record.uri?eid=2-s2.0-84902242112&doi=10.1155%2f2014%2f410758&partnerID=40&md5=3cdd9ca88b5023cb0ce67f0e5d25aeb9
AV  - none
JF  - Journal of Electrical and Computer Engineering
PB  - Hindawi Publishing Corporation
SN  - 20900147
VL  - 2014
TI  - Programmed tool for quantifying reliability and its application in designing circuit systems
Y1  - 2014///
N1  - cited By 0
A1  - Singh, N.S.S.
N2  - As CMOS technology scales down to nanotechnologies, reliability continues to be a decisive subject in the design entry of nanotechnology-based circuit systems. As a result, several computational methodologies have been proposed to evaluate reliability of those circuit systems. However, the process of computing reliability has become very time consuming and troublesome as the computational complexity grows exponentially with the dimension of circuit systems. Therefore, being able to speed up the task of reliability analysis is fast becoming necessary in designing modern logic integrated circuits. For this purpose, the paper firstly looks into developing a MATLAB-based automated reliability tool by incorporating the generalized form of the existing computational approaches that can be found in the current literature. Secondly, a comparative study involving those existing computational approaches is carried out on a set of standard benchmark test circuits. Finally, the paper continues to find the exact error bound for individual faulty gates as it plays a significant role in the reliability of circuit systems. © 2014 N. S. S. Singh.
ER  -