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primary topic: Programmed tool for quantifying reliability and its application in designing circuit systems

Programmed tool for quantifying reliability and its application in designing circuit systems
type: AcademicArticle
type: Article
abstract: As CMOS technology scales down to nanotechnologies, reliability continues to be a decisive subject in the design entry of nanotechnology-based circuit systems. As a result, several computational methodologies have been proposed to evaluate reliability of those circuit systems. However, the process of computing reliability has become very time consuming and troublesome as the computational complexity grows exponentially with the dimension of circuit systems. Therefore, being able to speed up the task of reliability analysis is fast becoming necessary in designing modern logic integrated circuits. For this purpose, the paper firstly looks into developing a MATLAB-based automated reliability tool by incorporating the generalized form of the existing computational approaches that can be found in the current literature. Secondly, a comparative study involving those existing computational approaches is carried out on a set of standard benchmark test circuits. Finally, the paper continues to find the exact error bound for individual faulty gates as it plays a significant role in the reliability of circuit systems. © 2014 N. S. S. Singh.
date: 2014
volume: 2014
is part of: Journal of Electrical and Computer Engineering
status: peerReviewed
status: published
author list: authors
type: EPrint
type: ArticleEPrint
is part of: repository

Hindawi Publishing Corporation
type: Organization

Journal of Electrical and Computer Engineering
type: Collection
issn: 20900147

N.S.S. Singh
type: Person
given name: N.S.S.
family name: Singh

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primary topic: Programmed tool for quantifying reliability and its application in designing circuit systems