eprintid: 5193
rev_number: 2
eprint_status: archive
userid: 1
dir: disk0/00/00/51/93
datestamp: 2023-11-09 16:16:55
lastmod: 2023-11-09 16:16:55
status_changed: 2023-11-09 16:00:52
type: article
metadata_visibility: show
creators_name: Shaheen, A.-R.
creators_name: Hussin, F.A.
creators_name: Hamid, N.H.
creators_name: Ali, N.B.Z.
title: A review on structural software-based self-testing of embedded processors
ispublished: pub
note: cited By 1
abstract: Proposed software-based self-test (SBST) techniques for embedded processor testing recently emerged as an effective substitute to the hardware built-in self-test (BIST) and classical external tester-based testing. These SBST approaches provide the high quality at-speed testing with additional features and reduce the high cost of hardware. This paper presents a survey on the structural software-based self-testing (SBST) of embedded processors for manufacturing test. This paper goes over the main points of structural-based self-testing techniques for manufacturing and functional testing of an embedded processor (e.g. Hierarchical-based and Register-Transfer Level-based (RTL-based)). Finally, an overview of the remarkable accomplishments of SBST and the major challenges faced in making these techniques reliable for industrial processors is presented. © 2014 Praise Worthy Prize S.r.l. - All rights reserved.
date: 2014
publisher: Praise Worthy Prize
official_url: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84903594076&partnerID=40&md5=7af4de0ee59388985358fc622dcbcd50
full_text_status: none
publication: International Review on Computers and Software
volume: 9
number: 5
pagerange: 832-846
refereed: TRUE
issn: 18286003
citation:   Shaheen, A.-R. and Hussin, F.A. and Hamid, N.H. and Ali, N.B.Z.  (2014) A review on structural software-based self-testing of embedded processors.  International Review on Computers and Software, 9 (5).  pp. 832-846.  ISSN 18286003