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primary topic: Superior model for fault tolerance computation in designing nano-sized circuit systems

Superior model for fault tolerance computation in designing nano-sized circuit systems
type: AcademicArticle
type: Article
abstract: As CMOS technology scales nano-metrically, reliability turns out to be a decisive subject in the design methodology of nano-sized circuit systems. As a result, several computational approaches have been developed to compute and evaluate reliability of desired nano-electronic circuits. The process of computing reliability becomes very troublesome and time consuming as the computational complexity build ups with the desired circuit size. Therefore, being able to measure reliability instantly and superiorly is fast becoming necessary in designing modern logic integrated circuits. For this purpose, the paper firstly looks into the development of an automated reliability evaluation tool based on the generalization of Probabilistic Gate Model (PGM) and Boolean Difference-based Error Calculator (BDEC) models. The Matlab-based tool allows users to significantly speed-up the task of reliability analysis for very large number of nano-electronic circuits. Secondly, by using the developed automated tool, the paper explores into a comparative study involving reliability computation and evaluation by PGM and, BDEC models for different implementations of same functionality circuits. Based on the reliability analysis, BDEC gives exact and transparent reliability measures, but as the complexity of the same functionality circuits with respect to gate error increases, reliability measure by BDEC tends to be lower than the reliability measure by PGM. The lesser reliability measure by BDEC is well explained in this paper using distribution of different signal input patterns overtime for same functionality circuits. Simulation results conclude that the reliability measure by BDEC depends not only on faulty gates but it also depends on circuit topology, probability of input signals being one or zero and also probability of error on signal lines. © 2014 AIP Publishing LLC.
date: 2014
volume: 1621
is part of: AIP Conference Proceedings
status: peerReviewed
status: published
author list: authors
type: EPrint
type: ConferenceItemEPrint
is part of: repository

American Institute of Physics Inc.
type: Organization

AIP Conference Proceedings
type: Collection
issn: 0094243X

V.S. Asirvadam
type: Person
given name: V.S.
family name: Asirvadam

N.S.S. Singh
type: Person
given name: N.S.S.
family name: Singh

M.S. Muthuvalu
type: Person
given name: M.S.
family name: Muthuvalu

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primary topic: Superior model for fault tolerance computation in designing nano-sized circuit systems