TY  - CONF
AV  - none
N2  - IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability. © 2014 IEEE.
N1  - cited By 0; Conference of 10th IEEE Dallas Circuits and Systems Conference, DCAS 2014 ; Conference Date: 12 October 2014 Through 13 October 2014; Conference Code:109417
TI  - Enhancement in IEEE 1500 standard for at-speed test and debug
ID  - scholars4116
KW  - Program debugging; Software testing; Testing
KW  -  At-speed test; Embedded cores; Functional Debug; Functional test; Ieee 1500 standards; Mode of operations; Software based self testing
KW  -  IEEE Standards
Y1  - 2014///
PB  - Institute of Electrical and Electronics Engineers Inc.
SN  - 9781479959235
A1  - Ali, G.
A1  - Hussin, F.A.
A1  - Ali, N.B.Z.
A1  - Hamid, N.H.
A1  - Adnan, R.M.
UR  - https://www.scopus.com/inward/record.uri?eid=2-s2.0-84918573516&doi=10.1109%2fDCAS.2014.6965327&partnerID=40&md5=70c064659d44c6010b1c7b7aa6d85b2c
ER  -