%0 Conference Paper
%A Ali, G.
%A Hussin, F.A.
%A Ali, N.B.Z.
%A Hamid, N.H.
%A Adnan, R.M.
%D 2014
%F scholars:4116
%I Institute of Electrical and Electronics Engineers Inc.
%K Program debugging; Software testing; Testing, At-speed test; Embedded cores; Functional Debug; Functional test; Ieee 1500 standards; Mode of operations; Software based self testing, IEEE Standards
%R 10.1109/DCAS.2014.6965327
%T Enhancement in IEEE 1500 standard for at-speed test and debug
%U https://khub.utp.edu.my/scholars/4116/
%X IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability. © 2014 IEEE.
%Z cited By 0; Conference of 10th IEEE Dallas Circuits and Systems Conference, DCAS 2014 ; Conference Date: 12 October 2014 Through 13 October 2014; Conference Code:109417