relation: https://khub.utp.edu.my/scholars/4116/
title: Enhancement in IEEE 1500 standard for at-speed test and debug
creator: Ali, G.
creator: Hussin, F.A.
creator: Ali, N.B.Z.
creator: Hamid, N.H.
creator: Adnan, R.M.
description: IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability. © 2014 IEEE.
publisher: Institute of Electrical and Electronics Engineers Inc.
date: 2014
type: Conference or Workshop Item
type: PeerReviewed
identifier:   Ali, G. and Hussin, F.A. and Ali, N.B.Z. and Hamid, N.H. and Adnan, R.M.  (2014) Enhancement in IEEE 1500 standard for at-speed test and debug.  In: UNSPECIFIED.     
relation: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84918573516&doi=10.1109%2fDCAS.2014.6965327&partnerID=40&md5=70c064659d44c6010b1c7b7aa6d85b2c
relation: 10.1109/DCAS.2014.6965327
identifier: 10.1109/DCAS.2014.6965327