@inproceedings{scholars378,
            year = {2008},
           title = {Design of a 10 GHz ring oscillator for PDK verification},
           pages = {122--125},
         journal = {IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE},
         address = {Johor Bahru, Johor},
             doi = {10.1109/SMELEC.2008.4770290},
            note = {cited By 1; Conference of 2008 IEEE International Conference on Semiconductor Electronics, ICSE 2008 ; Conference Date: 25 November 2008 Through 27 November 2008; Conference Code:76092},
            isbn = {9781424425617},
          author = {Nawi, I. M. and Kordesch, A. V.},
             url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-65949124681&doi=10.1109\%2fSMELEC.2008.4770290&partnerID=40&md5=679064dab7fd3e1b73a9408211b8436e},
        abstract = {In this work we developed a set of a 10 GHz Ring Oscillators for the purpose of verifying the accuracy of a CMOS foundry's design tools. The project involves front end to back end design, to tapeout. After fabrication of the chip was completed, measurements were performed to test the accuracy of the oscillators. This test chip was used to verify Silterra's PDK (Process Design Kit). Four different oscillator circuits were fabricated. The results show excellent agreement between simulated and measured gate delay. {\^A}{\copyright}2008 IEEE.},
        keywords = {Back-end design; Design tool; Front end; Gate delays; Oscillator circuits; Process design kit; Ring oscillator; Test chips, Oscillators (electronic); Process engineering, Design}
}