@inproceedings{scholars2757,
           title = {CST simulation of magnetic field for PCB fault investigation},
         address = {Kuala Lumpur},
            note = {cited By 2; Conference of 2012 4th International Conference on Intelligent and Advanced Systems, ICIAS 2012 ; Conference Date: 12 June 2012 Through 14 June 2012; Conference Code:93534},
          volume = {1},
             doi = {10.1109/ICIAS.2012.6306228},
         journal = {ICIAS 2012 - 2012 4th International Conference on Intelligent and Advanced Systems: A Conference of World Engineering, Science and Technology Congress (ESTCON) - Conference Proceedings},
           pages = {407--411},
            year = {2012},
            isbn = {9781457719677},
          author = {Socheatra, S. and Zain Ali, N. B. and Md Khir, M. H.},
        abstract = {This paper proposes a feasibility study of using Magnetic field property in detecting defects on printed circuit board (PCB) conductors. Simple microstrip transmission lines have been proposed and modeled as a non-defective line and defective lines in Computer Simulation Technology (CST) Microwave Studio in the purpose to observe the characteristic of magnetic field intensity (H) at 3 mm above the conduction lines. Types of defects that have been brought to study are stuck-at-faults and stuck-open fault. CST simulation has shown that the non-defective line induces a typically constant H field along the conduction line; however the defective lines produce high standing waves of H field at the points of defect. These results provide a very crucial knowledge in using magnetic field to diagnose and locate the defect detection on PCB. {\^A}{\copyright} 2012 IEEE.},
        keywords = {Computer simulation technology; Crucial knowledge; Defect detection; Defective lines; Feasibility studies; Magnetic-field intensity; Microstrip transmission lines; Microwave studios; Standing wave; Stuck-at faults; Stuck-open faults, Computer simulation; Defects; Organic pollutants, Magnetic fields},
             url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84867937682&doi=10.1109\%2fICIAS.2012.6306228&partnerID=40&md5=176497ebe90a51cd72911eb8c953749a}
}