@inproceedings{scholars2738,
         journal = {ICIAS 2012 - 2012 4th International Conference on Intelligent and Advanced Systems: A Conference of World Engineering, Science and Technology Congress (ESTCON) - Conference Proceedings},
           pages = {860--865},
            year = {2012},
         address = {Kuala Lumpur},
           title = {Resistance dependent delay behaviour of resistive open faults in multi voltage designs},
          volume = {2},
            note = {cited By 0; Conference of 2012 4th International Conference on Intelligent and Advanced Systems, ICIAS 2012 ; Conference Date: 12 June 2012 Through 14 June 2012; Conference Code:93534},
             doi = {10.1109/ICIAS.2012.6306135},
          author = {Mohammadat, M. T. E. and Ali, N. B. Z. and Hussin, F. A.},
            isbn = {9781457719677},
        keywords = {Battery powered; Benchmark circuit; Dynamic voltage scaling; Multi-voltage; Open Resistance Intervals; Portable device; Resistive open, Voltage stabilizing circuits, Electronic equipment testing},
             url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84867950212&doi=10.1109\%2fICIAS.2012.6306135&partnerID=40&md5=8688dd0aa9f5a7d6f7b0fb6f4bca884f},
        abstract = {Multi-voltage designs are becoming omnipresent in most of state-of-the-art battery powered portable devices. Understanding the fault behaviour in multi-voltage environment helps in testing such devices for voltage dependent manufacturing faults. Resistive open fault is a major class of such faults, therefore in this paper, we studied its behaviour (manifested as extra delay) in multi-voltage like environment. The extra delay caused by resistive open faults versus voltage is analysed for the full range of open resistance. It is showed that the pattern of this delay as a function of V DD is resistance dependent. This observation was validated using a set of benchmark circuits and technology models. Based on this observation, we proposed treating the full range of opens resistances as smaller subsets of resistance intervals according to the behaviour manifested. {\^A}{\copyright} 2011 IEEE.}
}