eprintid: 2715
rev_number: 2
eprint_status: archive
userid: 1
dir: disk0/00/00/27/15
datestamp: 2023-11-09 15:50:57
lastmod: 2023-11-09 15:50:57
status_changed: 2023-11-09 15:44:07
type: conference_item
metadata_visibility: show
creators_name: Anwer, J.
creators_name: Shaukat, S.F.
creators_name: Khalid, U.
creators_name: Hamid, N.H.
title: Reliable area index: A novel approach to measure reliability of Markov Random Field based circuits
ispublished: pub
keywords: Area index; Area overhead; Circuit designs; Design approaches; Markov Random Fields; Noise immunity; Noise-tolerance; Noise-Tolerant, Commerce; Engineering research, Integrated circuit manufacture
note: cited By 2; Conference of 2012 4th International Conference on Intelligent and Advanced Systems, ICIAS 2012 ; Conference Date: 12 June 2012 Through 14 June 2012; Conference Code:93534
abstract: Markov Random Field (MRF) is a probabilistic circuit design approach that transforms simple CMOS to MRF-CMOS digital circuits. The transformed circuits are proved to be extremely noise-tolerant in the previous research literature. In this paper, we have quantified the noise tolerance capability of MRF circuits as compared to CMOS counterparts. The tradeoff for this noise-immunity is the increase in transistor-count of the circuit. This tradeoff is modelled by a novel factor in this research work called as reliable area index. The results show that the value of this index is 30 times higher for MRF than CMOS which proves that the MRF design approach still maintains a suitable tradeoff between noise-tolerance and area overhead of the circuit. © 2011 IEEE.
date: 2012
official_url: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84867962657&doi=10.1109%2fICIAS.2012.6306133&partnerID=40&md5=84014e994589ca089afddfda709c6b01
id_number: 10.1109/ICIAS.2012.6306133
full_text_status: none
publication: ICIAS 2012 - 2012 4th International Conference on Intelligent and Advanced Systems: A Conference of World Engineering, Science and Technology Congress (ESTCON) - Conference Proceedings
volume: 2
place_of_pub: Kuala Lumpur
pagerange: 851-853
refereed: TRUE
isbn: 9781457719677
citation:   Anwer, J. and Shaukat, S.F. and Khalid, U. and Hamid, N.H.  (2012) Reliable area index: A novel approach to measure reliability of Markov Random Field based circuits.  In: UNSPECIFIED.