TY  - CONF
AV  - none
CY  - Bangkok
ID  - scholars2471
TI  - Accurate modeling method to evaluate reliability of nanoscale circuits
KW  - boolean difference-based error calculator (BDEC); integrated logic circuis; Probabilistic gate model (PGM); Probabilistic transfer matrixes (PTM); Reliability Evaluation
KW  -  Benchmarking; CMOS integrated circuits; Electron devices; Integrated circuit manufacture; Mathematical instruments; Nanotechnology; Transfer matrix method
KW  -  Reliability
N2  - Reliability has become an important design consideration for integrated circuits especially as CMOS dimension enters into the nanoscale regime. An ability to accurately measure reliability of CMOS circuits has become very crucial. Tools such as Probabilistic Gate Model (PGM), Boolean Difference-based Error Calculator (BDEC) and Probabilistic Transfer Matrix (PTM) have been developed to measure reliability of a given circuit. However, there has not been work done to determine the efficiency of these tools in giving not only accurate but transparent reliability measure. In this work, a general computational technique based on statistical dependency of circuit's input/output signals has been developed to validate the accurateness and correctness of the evaluation tools in computing reliability of selected benchmark test circuits. The computation is carried out by partitioning the benchmark test circuits. The reliability measures yield from these partitions are then evaluated for the selection of efficient tool. The statistical dependency-based method enables a simple yet competent way to conclude that PTM gives significantly adequate reliability measure compared to PGM and BDEC. Therefore, to obtain best circuit design with highest reliability measure, PTM modeling method would be the best consideration for reliability evaluation of nanoscale circuits. © 2012 IEEE.
N1  - cited By 3; Conference of 2012 8th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2012 ; Conference Date: 3 December 2012 Through 5 December 2012; Conference Code:96339
SN  - 9781467356961
Y1  - 2012///
A1  - Singh, N.S.S.
A1  - Hamid, N.H.
A1  - Asirvadam, V.S.
UR  - https://www.scopus.com/inward/record.uri?eid=2-s2.0-84875730397&doi=10.1109%2fEDSSC.2012.6482862&partnerID=40&md5=32e2e8fc657a8756569298ee51b29c3a
ER  -