eprintid: 2242 rev_number: 2 eprint_status: archive userid: 1 dir: disk0/00/00/22/42 datestamp: 2023-11-09 15:50:27 lastmod: 2023-11-09 15:50:27 status_changed: 2023-11-09 15:42:19 type: article metadata_visibility: show creators_name: Iffa, E.D. creators_name: Aziz, A.R.A. creators_name: Malik, A.S. title: Velocity field measurement of a round jet using quantitative schlieren ispublished: pub keywords: Anemometers; Power spectral density; Spectral density, Background oriented schlieren; Hot wire anemometers; Light deflection; Optical flow algorithm; Turbulence parameters; Vector estimation; Velocity field measurement; Velocity parameters, Velocity note: cited By 4 abstract: This paper utilizes the background oriented schlieren (BOS) technique to measure the velocity field of a variable density round jet. The density field of the jet is computed based on the light deflection created during the passage of light through the understudy jet. The deflection vector estimation was carried out using phase-based optical flow algorithms. The density field is further exploited to extract the axial and radial velocity vectors with the aid of continuity and energy equations. The experiment is conducted at six different jet-exit temperature values. Additional turbulence parameters, such as velocity variance and power spectral density of the vector field, are also computed. Finally, the measured velocity parameters are compared with the hot wire anemometer measurements and their correlation is displayed. © 2011 Optical Society of America. date: 2011 publisher: OSA - The Optical Society official_url: https://www.scopus.com/inward/record.uri?eid=2-s2.0-79951997042&doi=10.1364%2fAO.50.000618&partnerID=40&md5=8e0cd7dca2dba92dc4ad980aa84713b8 id_number: 10.1364/AO.50.000618 full_text_status: none publication: Applied Optics volume: 50 number: 5 pagerange: 618-625 refereed: TRUE issn: 1559128X citation: Iffa, E.D. and Aziz, A.R.A. and Malik, A.S. (2011) Velocity field measurement of a round jet using quantitative schlieren. Applied Optics, 50 (5). pp. 618-625. ISSN 1559128X