eprintid: 20366
rev_number: 3
eprint_status: archive
userid: 1
dir: disk0/00/02/03/66
datestamp: 2025-11-06 06:20:44
lastmod: 2025-11-06 06:20:44
status_changed: 2025-11-06 06:20:44
type: conference_item
metadata_visibility: show
creators_name: Suman, Sukhavasi
creators_name: Perumal, Thinagaran
creators_name: Mustapha, Norwati
creators_name: Yaakob, Razali
creators_name: Ahmadon, Mohd Anuaruddin
creators_name: Yamaguchi, Shingo
title: Semantic interoperability test method for data schema comparison with constrained application protocol
ispublished: pub
note: Cited by: 0
date: 2019
publisher: Institute of Electrical and Electronics Engineers Inc.
official_url: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85081946253&doi=10.1109%2fGCCE46687.2019.9015271&partnerID=40&md5=1459a81ccc23ad011cde224a0f15beeb
id_number: 10.1109/GCCE46687.2019.9015271
full_text_status: none
publication: 2019 IEEE 8th Global Conference on Consumer Electronics, GCCE 2019
pagerange: 640 – 641
refereed: TRUE
isbn: 978-172813575-5
citation:   Suman, Sukhavasi and Perumal, Thinagaran and Mustapha, Norwati and Yaakob, Razali and Ahmadon, Mohd Anuaruddin and Yamaguchi, Shingo  (2019) Semantic interoperability test method for data schema comparison with constrained application protocol.  In: UNSPECIFIED.