@inproceedings{scholars1949, year = {2011}, doi = {10.1109/DTIS.2011.5941442}, note = {cited By 1; Conference of 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 ; Conference Date: 6 April 2011 Through 8 April 2011; Conference Code:86189}, journal = {6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program}, title = {Automated model conversion for analogue simulation based on SPICE-level description}, address = {Athens}, keywords = {Automatic Generation; Circuit models; Delta operators; Macro model; Macro-models; Model conversion; Multiple input single outputs; Multiple models; Non-Linearity; Operational amplifier (opamp); Output errors; Simulation-based; Single-input single-output; System identifications; Two stage; Work environments, Automatic programming; Circuit simulation; Computer hardware description languages; Computer simulation; Human engineering; Integrated control; Nanostructured materials; Nanotechnology; Operational amplifiers; Transient analysis, SPICE}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-80052088409&doi=10.1109\%2fDTIS.2011.5941442&partnerID=40&md5=d3a70f12aa5f3b5a39124a436a916fb4}, abstract = {Automatic generation of circuit models has received great interest over the last few years, the models generated need to be used in the different work environment. This paper introduces the multiple model conversion system (MMCSD) to automatically convert the models into hardware description language (HDL) models for either single-input single-output (SISO) or multiple-input single-output (MISO) macromodels and behave as the operational amplifier (opamp). These models are obtained from the multiple model generation system using delta operator (MMGSD). It detects nonlinearity through variations in output error. We demonstrate the application of MMGSD using a two-stage CMOS opamp, comparing simulations of the macromodel against those of the original SPICE circuit utilizing transient analysis. {\^A}{\copyright} 2011 IEEE.}, author = {Xia, L. and Bell, I. M. and Wilkinson, A. J.}, isbn = {9781612848990} }