TY - JOUR Y1 - 2011/// VL - 11 A1 - Khir, M.H.M. A1 - Qu, P. A1 - Qu, H. JF - Sensors UR - https://www.scopus.com/inward/record.uri?eid=2-s2.0-80052163190&doi=10.3390%2fs110807892&partnerID=40&md5=c6e3dc51eb84b8a592ffdcf5558ef28f ID - scholars1920 KW - silicon KW - acceleration; article; calibration; chemistry; computer program; computer system; equipment design; heat; methodology; microelectromechanical system; scanning electron microscopy; semiconductor; sensitivity and specificity; statistical model; temperature KW - Acceleration; Calibration; Computer Systems; Equipment Design; Hot Temperature; Micro-Electrical-Mechanical Systems; Microscopy KW - Electron KW - Scanning; Models KW - Statistical; Semiconductors; Sensitivity and Specificity; Silicon; Software; Temperature N2 - This paper reports a low-cost, high-sensitivity CMOS-MEMS piezoresistive accelerometer with large proof mass. In the device fabricated using ON Semiconductor 0.5 μm CMOS technology, an inherent CMOS polysilicon thin film is utilized as the piezoresistive sensing material. A full Wheatstone bridge was constructed through easy wiring allowed by the three metal layers in the 0.5 μm CMOS technology. The device fabrication process consisted of a standard CMOS process for sensor configuration, and a deep reactive ion etching (DRIE) based post-CMOS microfabrication for MEMS structure release. A bulk single-crystal silicon (SCS) substrate is included in the proof mass to increase sensor sensitivity. In device design and analysis, the self heating of the polysilicon piezoresistors and its effect to the sensor performance is also discussed. With a low operating power of 1.5 mW, the accelerometer demonstrates a sensitivity of 0.077 mV/g prior to any amplification. Dynamic tests have been conducted with a high-end commercial calibrating accelerometer as reference. © 2011 by the authors; licensee MDPI, Basel, Switzerland. IS - 8 SN - 14248220 EP - 7907 AV - none TI - A low-cost CMOS-MEMS piezoresistive accelerometer with large proof mass SP - 7892 N1 - cited By 40 ER -