TY - CONF KW - 3D modeling; Antennas; Architectural design; Image reconstruction; Mean square error; Photogrammetry; Project management KW - 3D models; 3d-modeling; Accuracy assessment; Building Information Modelling; Close range photogrammetry; Distance equations; Error calculations; Monument restoration; Root mean square errors; Terrestrial photogrammetries KW - Restoration ID - scholars18921 SP - 100 TI - Enhancing Construction Management In Restoration Through BIM-Assisted Photogrammetric 3D Model Accuracy Assessment N1 - cited By 0; Conference of 2023 International Conference on Sustaining Heritage: Innovative and Digital Approaches, ICSH 2023 ; Conference Date: 18 June 2023 Through 19 June 2023; Conference Code:198561 N2 - This paper presents a study on the accuracy assessment of 3D models generated through photogrammetry for monument restoration using Building Information Modeling (BIM) software. The point-to-plane distance equation was used to calculate the accuracy of the 3D models, and a root mean square error (RMSE) calculation was performed to compare the coordinates of specific points on the actual building with the coordinates of the corresponding points on the 3D model. The types of photogrammetric methods, including aerial and terrestrial photogrammetry, were also discussed, along with the two main techniques of terrestrial photogrammetry: close-range photogrammetry and industrial photogrammetry. Agisoft Metashape was used for close-range photogrammetry applications. The results showed that the point-to-plane distance equation and RMSE calculation are effective tools for assessing the accuracy of 3D models generated through photogrammetry for monument restoration using BIM. © 2023 IEEE. AV - none EP - 103 UR - https://www.scopus.com/inward/record.uri?eid=2-s2.0-85190494888&doi=10.1109%2fICSH57060.2023.10482845&partnerID=40&md5=5318d264b0da76bfda37b96369401d16 A1 - Saad, S. A1 - Ammad, S. A1 - Rasheed, K. A1 - Balbehaith, M. A1 - Qureshi, A.H. A1 - Bashir, M.T. SN - 9798350398281 PB - Institute of Electrical and Electronics Engineers Inc. Y1 - 2023/// ER -