TY  - CONF
A1  - Khalid, U.
A1  - Anwer, J.
A1  - Singh, N.
A1  - Hamid, N.H.
A1  - Asirvadam, V.S.
UR  - https://www.scopus.com/inward/record.uri?eid=2-s2.0-84857066628&doi=10.1109%2fNatPC.2011.6136386&partnerID=40&md5=55f804ee3d5e99055bc19715ad582e03
Y1  - 2011///
SN  - 9781457718847
N1  - cited By 6; Conference of 3rd National Postgraduate Conference - Energy and Sustainability: Exploring the Innovative Minds, NPC 2011 ; Conference Date: 19 September 2011 Through 20 September 2011; Conference Code:88531
N2  - The reliability is one of the serious issues confronted by microelectronics industry as feature sizes scale down to nano-design level. In this paper, we are providing the analysis to find the accurate and efficient method of finding circuit's reliability among the available options. The experimental results provide the reliability evaluation of few probabilistic computation schemes. The comparison will be done on unique platform to choose the best scheme amongst all. The simulations have been conducted on small test digital circuits including LGSynth'93 circuits. © 2011 IEEE.
ID  - scholars1742
TI  - Reliability-evaluation of digital circuits using probabilistic computation schemes
KW  - Boolean difference based error calculator; Feature sizes; Gate models; Microelectronics industry; Probabilistic computation; Reliability Evaluation; Scale down; Transfer matrixes
KW  -  Bayesian networks; Calculations; Digital circuits; Microelectronics; Reliability; Sustainable development; Transfer matrix method
KW  -  Reliability analysis
CY  - Perak
AV  - none
ER  -