eprintid: 1724
rev_number: 2
eprint_status: archive
userid: 1
dir: disk0/00/00/17/24
datestamp: 2023-11-09 15:49:53
lastmod: 2023-11-09 15:49:53
status_changed: 2023-11-09 15:41:13
type: conference_item
metadata_visibility: show
creators_name: Farooq, M.U.
creators_name: Xia, L.
creators_name: Azmadi, F.
title: A critical survey on automated model generation techniques for high level modeling and high level fault modeling
ispublished: pub
keywords: Automatic model generation; High Level Fault Simulation (HLFS); High-level fault; strongly non-linear Weekly Nonlinear; Transistor Level Fault Simulation (TLFS); VHDL-AMS, Computer simulation; Electric signal systems; Integrated circuits; Mathematical models; Semiconductor device manufacture; Sustainable development, Surveys
note: cited By 2; Conference of 3rd National Postgraduate Conference - Energy and Sustainability: Exploring the Innovative Minds, NPC 2011 ; Conference Date: 19 September 2011 Through 20 September 2011; Conference Code:88531
abstract: An analog circuit testing is considered to be most difficult and time consuming in modern mixed signal circuits design cycle. Rapid development in semiconductor technology increases the density of circuit in the chip. Testing these circuits for defects and faults using transistor level simulations is not only extremely time consuming but also very costly in terms of computational resources. Therefore, efficient alternative techniques are proposed which increase the fault simulation speed to save overall verification time. One such technique recently introduced is high level fault modeling and simulation. This technique makes use of mathematical models automatically generated for linear or nonlinear responses and replicate exact behavior of original circuits. These linear and nonlinear responses are then mapped to fault-free and faulty circuits respectively and then simulations are compared with original transistor level fault-free and faulty simulations. The objective of this paper is to provide a critical survey on automated model generation techniques and analyze them for higher level modeling and high level fault modeling. © 2011 IEEE.
date: 2011
official_url: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84857067861&doi=10.1109%2fNatPC.2011.6136335&partnerID=40&md5=ad17b4426ea87145c3d26235f65b0553
id_number: 10.1109/NatPC.2011.6136335
full_text_status: none
publication: 2011 National Postgraduate Conference - Energy and Sustainability: Exploring the Innovative Minds, NPC 2011
place_of_pub: Perak
refereed: TRUE
isbn: 9781457718847
citation:   Farooq, M.U. and Xia, L. and Azmadi, F.  (2011) A critical survey on automated model generation techniques for high level modeling and high level fault modeling.  In: UNSPECIFIED.