TY - CONF ID - scholars14918 TI - Experimenting and evaluating the impact of DoS attacks on different SDN controllers SP - 722 KW - Automation; Computer system recovery; Denial-of-service attack; Electric lighting; Floods; Open source software; Process control KW - Control channels; Control data; Denial of Service; Flooding attacks; Recovery rate; Software defined networking (SDN); Testing tools; Variable delays KW - Controllers N1 - cited By 6; Conference of 1st IEEE International Maghreb Meeting of the Conference on Sciences and Techniques of Automatic Control and Computer Engineering, MI-STA 2021 ; Conference Date: 25 May 2021 Through 27 May 2021; Conference Code:171040 N2 - The flexibility and centrality of Software Defined Networking (SDN) has made it vulnerable to Denial of Service (DoS) attacks. Despite of the advantages, the potential DoS attacks may compromise the functions of switches, control channel and SDN controller. This paper is devoted to simulating and analyzing the impact of DoS packet in flooding attacks on SDN controller and control channel which may even affect the whole SDN network. The network performance is tested and emulated by using different testing tools of simulation in Mininet such as Hping3 and Wireshark. Likewise, the three different SDN controllers Floodlight, Ryu and POX performed as the uplink control data. Our findings show that with quite limited resources in pure open source SDN controllers, an attacker can produce a major distraction against an SDN networks. The recovery rate of SDN controllers show variable delay weakness between controllers' performance: that the best result for the Ryu controller after sequences packets 6, and the worst recovery rate for POX controller after sequences packets 47. © 2021 IEEE. AV - none EP - 727 A1 - Alashhab, A.A. A1 - Soperi Mohd Zahid, M. A1 - Barka, A.A. A1 - Albaboh, A.M. UR - https://www.scopus.com/inward/record.uri?eid=2-s2.0-85113651747&doi=10.1109%2fMI-STA52233.2021.9464469&partnerID=40&md5=1e45d8e127d5c94656cde57dc90c4ab7 PB - Institute of Electrical and Electronics Engineers Inc. SN - 9781665418560 Y1 - 2021/// ER -