@article{scholars14582, year = {2021}, publisher = {MDPI AG}, journal = {Applied Sciences (Switzerland)}, doi = {10.3390/app11167626}, volume = {11}, note = {cited By 11}, number = {16}, title = {Influence of building information modeling (Bim) implementation in high-rise buildings towards sustainability}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85113442665&doi=10.3390\%2fapp11167626&partnerID=40&md5=633a505272b0deb950ccce8cc2c05e2c}, abstract = {To secure full benefits without jeopardizing project feasibility, sustainability standards in high-rise building design should be included at all phases of the decision-making process. How-ever, there are limited empirical studies on the influence of building information modeling (BIM) implementation in high-rise buildings. Implementing BIM is a viable technique to improve high-rise building sustainability performance. Therefore, the aim of this research is to explore the influence of BIM implementation in high-rise buildings by integrating the exploratory factor analysis (EFA) and structural equation modeling (SEM) approaches. Following a detailed review of the literature to identify critical success factors (CSFs) for BIM implementation, empirical evidence was gathered through a questionnaire survey with 205 stakeholders in construction projects. The EFA revealed five components, namely, productivity, visualization, coordination, sustainability, and safety improve-ment, all of which have a significant impact on the long-term construction of high-rise buildings. Moreover, SEM was conducted to develop the model for high-rise buildings. However, it has been revealed that awareness and usage level of BIM technology in high-rise buildings still appears to be limited. This scenario paves the way for future researchers to develop more models in the domain of high-rise buildings in order to improve sustainable development. {\^A}{\copyright} 2021 by the authors. Licensee MDPI, Basel, Switzerland.}, issn = {20763417}, author = {Manzoor, B. and Othman, I. and Kang, J. M. and Geem, Z. W.} }