eprintid: 1340
rev_number: 2
eprint_status: archive
userid: 1
dir: disk0/00/00/13/40
datestamp: 2023-11-09 15:49:30
lastmod: 2023-11-09 15:49:30
status_changed: 2023-11-09 15:39:31
type: article
metadata_visibility: show
creators_name: Xia, L.
creators_name: Ian, B.
creators_name: Antony, W.
title: Review of high level fault modeling approaches for mixed-signal systems1
ispublished: pub
note: cited By 1
abstract: In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the important part since every fault in the whole circuit has to be simulated at that level. Unfortunately, it is a very CPU intensive task even though it maintains the high accuracy. Therefore, High Level Fault Modeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the efforts of simulation. In this paper, different HLFM approaches are reviewed at the device level during last two decades. We clarify their domains of application and evaluate their strengths and current limitations. We also analyze causes of faults and introduce various test approaches. © 2010 Science Press, Institute of Electronics, CAS and Springer-Verlag Berlin Heidelberg.
date: 2010
publisher: Science Press
official_url: https://www.scopus.com/inward/record.uri?eid=2-s2.0-79952562891&doi=10.1007%2fs11767-011-0350-1&partnerID=40&md5=1fde08d0a9cf8bde76edc094b9971a6c
id_number: 10.1007/s11767-011-0350-1
full_text_status: none
publication: Journal of Electronics
volume: 27
number: 4
pagerange: 490-497
refereed: TRUE
issn: 02179822
citation:   Xia, L. and Ian, B. and Antony, W.  (2010) Review of high level fault modeling approaches for mixed-signal systems1.  Journal of Electronics, 27 (4).  pp. 490-497.  ISSN 02179822