TY  - JOUR
AV  - none
TI  - Review of high level fault modeling approaches for mixed-signal systems1
SP  - 490
N1  - cited By 1
PB  - Science Press
SN  - 02179822
EP  - 497
ID  - scholars1340
IS  - 4
N2  - In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the important part since every fault in the whole circuit has to be simulated at that level. Unfortunately, it is a very CPU intensive task even though it maintains the high accuracy. Therefore, High Level Fault Modeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the efforts of simulation. In this paper, different HLFM approaches are reviewed at the device level during last two decades. We clarify their domains of application and evaluate their strengths and current limitations. We also analyze causes of faults and introduce various test approaches. © 2010 Science Press, Institute of Electronics, CAS and Springer-Verlag Berlin Heidelberg.
Y1  - 2010///
VL  - 27
JF  - Journal of Electronics
A1  - Xia, L.
A1  - Ian, B.
A1  - Antony, W.
UR  - https://www.scopus.com/inward/record.uri?eid=2-s2.0-79952562891&doi=10.1007%2fs11767-011-0350-1&partnerID=40&md5=1fde08d0a9cf8bde76edc094b9971a6c
ER  -