?url_ver=Z39.88-2004&rft_id=10.1016%2Fj.ins.2017.10.040&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.aulast=Tan&rft.au=Tan%2C+S.C.&rft.aufirst=S.C.&rft.volume=427&rft.issn=00200255&rft.atitle=A+self-adaptive+class-imbalance+TSK+neural+network+with+applications+to+semiconductor+defects+detection&rft.pages=1-17&rft.title=Information+Sciences&rft.date=2018&rft.genre=article