In this paper optical simulations based on Transfer Matrix Method (TMM) is developed to investigate the performance of Carbon nanotube on silicon solar cells. Reflection of the incident photons by the silicon surface is a major source of losses for photovoltaic solar cell. However, these losses can be minimized by depositing an antireflection layer. Recently, antireflective coatings (ARCs) attract critical consideration for both their fundamental aspects and wide practical applications. The TMM solutions permit us to plot the optical reflectivity versus wavelengths and layer thicknesses. The optical refractive index and thicknesses of considered materials, which allowed us to have the lowest reflection, can be used to simulate the electrical properties of the cell with PC1D and Silvaco software in the future. ©2006-2016 Asian Research Publishing Network (ARPN).