Zafar, S. and Awan, M. and Zulkifli, T.Z.A. (2009) 5-GHz low-phase noise quadrature VCO in 0.13-μm RF CMOS process technology. In: UNSPECIFIED.
Full text not available from this repository.Abstract
In this paper, a 5 GHz low-phase noise RF CMOS quadrature voltage controlled oscillator (QVCO) is presented. The quadrature signals are generated by coupling two VCOs through pMOS coupling transistors. The tail biasing MOS current mirror is replaced with tail biasing resistor of 100 Ω, multifingers gate structure of pMOS varactor (3.125 μm width of each gate finger) and source damping resistor of 40 Ω are the techniques which are used to achieve low phase noise in proposed QVCO. The pMOS varactor releases the frequency tuning range of 5.26 from the center frequency of 5.13 GHz. The proposed QVCO core power dissipation is 3.7 mW from 1.2 V dc power supply. The QVCO exhibits the measured phase noise of -118.24 dBc/Hz at the offset frequency of 1 MHz. The calculated figure of merit is -186.7. The proposed QVCO is implemented utilizing 0.13 μm 1 poly 8 metal RF CMOS process technology. ©2009 IEEE.
Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Additional Information: | cited By 12; Conference of 2009 IEEE 10th Annual Wireless and Microwave Technology Conference, WAMICON 2009 ; Conference Date: 20 April 2009 Through 21 April 2009; Conference Code:78012 |
Uncontrolled Keywords: | Center frequency; Current mirrors; Damping resistors; DC power supplies; Figure of merit; Frequency tuning range; Gate fingers; Gate structure; Low phase noise; Multifingers; Offset frequencies; pMOS; Power dissipation; Quadrature signal; Quadrature VCO; Quadrature voltage controlled oscillator; QVCO; RF CMOS, Electric power utilization; Microwave devices; Microwaves; Resistors; Technology; Varactors; Variable frequency oscillators; Wireless telecommunication systems, Phase noise |
Depositing User: | Mr Ahmad Suhairi UTP |
Date Deposited: | 09 Nov 2023 15:48 |
Last Modified: | 09 Nov 2023 15:48 |
URI: | https://khub.utp.edu.my/scholars/id/eprint/655 |