Khalid, U. and Anwer, J. and Hamid, N.H. and Asirvadam, V.S. (2015) The impact of sensitive inputs on the reliability of nanoscale circuits. Springer International Publishing, pp. 249-269. ISBN 9783319200712; 9783319200705
Full text not available from this repository.Abstract
As CMOS technology scales to nanometer dimensions, its performance and behavior become less predictable. Reliability studies for nanocircuits and systems become important when the circuit�s outputs are affected by its sensitive noisy inputs. In conventional circuits, the impact of the inputs on reliability can be observed by the deterministic input patterns. However, in nanoscale circuits, the inputs behave probabilistically. The Bayesian networks technique is used to compute the reliability of a circuit in conjunction with the Monte Carlo simulations approach which is applied to model the probabilistic inputs and ultimately to determine sensitive inputs and worst-case input combinations. © Springer International Publishing Switzerland 2015.
Item Type: | Book |
---|---|
Additional Information: | cited By 0 |
Uncontrolled Keywords: | Bayesian networks; Monte Carlo methods; Nanotechnology; Timing circuits, CMOS technology; Conventional circuits; Input patterns; Nano-circuits; Nanometer dimensions; Nanoscale circuits; Worst-case input combinations, Reliability |
Depositing User: | Mr Ahmad Suhairi UTP |
Date Deposited: | 09 Nov 2023 16:18 |
Last Modified: | 09 Nov 2023 16:18 |
URI: | https://khub.utp.edu.my/scholars/id/eprint/6269 |