Testing of nickel-chrome alloy as a tip material for multi-tip langmuir probes

Naz, M.Y. and Shukrullah, S. and Ghaffar, A. and Shakir, I. and Ullah, S. and Sagir, M. (2014) Testing of nickel-chrome alloy as a tip material for multi-tip langmuir probes. Surface Review and Letters, 21 (4). ISSN 0218625X

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Abstract

The electrostatic probes are considered to be the most powerful and experimentally simplest technique for plasma characterization. The objective of the work was to test the nickel-chrome alloy as probe tip material for characterization of RF discharge plasmas. In order to meet the objective, a triple Langmuir probe diagnostic system and associated driving circuit was designed and tested in inductively coupled plasma (ICP) generated by a 13.56 MHz radio frequency (RF) source. Using this probe diagnostic, the electron temperature, electron number density and ion saturation current were measured as a function of input RF power and filling gas pressure. An increasing trend was noticed in electron temperature and electron number density with input power whilst a decreasing trend was evident in these parameters for increasing nitrogen gas pressure. The overall variations in electron temperature and electron number density after repeated measurements were ranging from 5 to 12 and 3 to 13, respectively. © 2014 World Scientific Publishing Company.

Item Type: Article
Additional Information: cited By 4
Uncontrolled Keywords: Electrons; Inductively coupled plasma; Langmuir probes; Nickel; Plasma theory; Probes; Electric discharges; Electrons; Inductively coupled plasma; Langmuir probes; Nickel; Nitrogen; Plasma theory; Probes; Radio waves, Electron number densities; Inductively coupled plasma (ICP); Ion saturation current; Nitrogen gas pressure; Plasma characterization; Radio frequency plasma; Radio frequency source; Triple langmuir probes, Electron temperature; Electron temperature
Depositing User: Mr Ahmad Suhairi UTP
Date Deposited: 09 Nov 2023 16:16
Last Modified: 09 Nov 2023 16:16
URI: https://khub.utp.edu.my/scholars/id/eprint/4992

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