Mohammadat, M.T. and Ali, N.B.Z. and Hussin, F.A. (2012) Multi-voltage aware resistive open fault modeling. In: UNSPECIFIED.
Full text not available from this repository.Abstract
Resistive open fault (ROF) represents common manufacturing defects causing extra delays and reliability risks in affected circuits. ROF behavior is sensitive to the supply voltage and the resistance of open (RO). Modeling this fault behavior and detectability with the supply voltage helps in distinguishing between faults as well as testing of multi-voltage designs. While previous ROF models did not explicitly consider these dependencies. Therefore in this paper, these dependencies were investigated by exhaustive parametric SPICE simulation considering different technology models. A voltage aware model is proposed by dividing the full RO continuum into resistance intervals and ranges. © 2012 IEEE.
Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Additional Information: | cited By 2; Conference of 2012 17th IEEE European Test Symposium, ETS 2012 ; Conference Date: 28 May 2012 Through 1 June 2012; Conference Code:91697 |
Uncontrolled Keywords: | Delay faults; Detectability; Manufacturing defects; Multi-voltage; Open Resistance Intervals; Resistive open; ROF model; SPICE simulations; Supply voltages, Computer simulation, SPICE |
Depositing User: | Mr Ahmad Suhairi UTP |
Date Deposited: | 09 Nov 2023 15:51 |
Last Modified: | 09 Nov 2023 15:51 |
URI: | https://khub.utp.edu.my/scholars/id/eprint/2921 |