Resistive open fault (ROF) represents common manufacturing defects causing extra delays and reliability risks in affected circuits. ROF behavior is sensitive to the supply voltage and the resistance of open (RO). Modeling this fault behavior and detectability with the supply voltage helps in distinguishing between faults as well as testing of multi-voltage designs. While previous ROF models did not explicitly consider these dependencies. Therefore in this paper, these dependencies were investigated by exhaustive parametric SPICE simulation considering different technology models. A voltage aware model is proposed by dividing the full RO continuum into resistance intervals and ranges. © 2012 IEEE.